Microscopic Image Deblurring by a Generative Adversarial Network for 2D Nanomaterials: Implications for Wafer-Scale Semiconductor Characterization-Reference-Cited by-同舟云学术

Microscopic Image Deblurring by a Generative Adversarial Network for 2D Nanomaterials: Implications for Wafer-Scale Semiconductor Characterization

Published:2022-09-12 Issue:9 Volume:5 Page:12855-12864
ISSN:2574-0970
Container-title:ACS Applied Nano Materials
language:en
Short-container-title:ACS Appl. Nano Mater.

Author:

Dong Xingchen¹^ORCID,Zhang Yucheng¹,Li Hongwei²³,Yan Yuntian¹,Li Jianqing¹,Song Jian⁴^ORCID,Wang Kun¹,Jakobi Martin¹,Yetisen Ali K.⁵^ORCID,Koch Alexander W.¹

Affiliation:

1. Department of Electrical and Computer Engineering, Institute for Measurement Systems and Sensor Technology, Technical University of Munich, 80333 Munich, Germany

2. Department of Computer Science, Technical University of Munich, 85748 Garching, Germany

3. Department of Quantitative Biomedicine, University of Zurich, 8057 Zurich, Switzerland

4. School of Biomedical Engineering, Sun Yat-sen University, 518107 Shenzhen, China

5. Department of Chemical Engineering, Imperial College London, SW7 2AZ London, U.K.

Publisher

American Chemical Society (ACS)

Subject

General Materials Science

Link

https://pubs.acs.org/doi/pdf/10.1021/acsanm.2c02725

Reference57 articles.

1. Van der Waals heterostructures

2. 2D materials and van der Waals heterostructures

3. Atomically ThinMoS2: A New Direct-Gap Semiconductor

4. Two-dimensional material nanophotonics

5. Electronics and optoelectronics of two-dimensional transition metal dichalcogenides

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