Electron Beam Induced Enhancement and Suppression of Oxidation in Cu Nanoparticles in Environmental Scanning Transmission Electron Microscopy-Reference-Cited by-同舟云学术

Electron Beam Induced Enhancement and Suppression of Oxidation in Cu Nanoparticles in Environmental Scanning Transmission Electron Microscopy

Author:

Ziashahabi Azin¹,Elsukova Anna²,Nilsson Sara³,Beleggia Marco¹⁴^ORCID,Stanley Jørgensen Peter⁵,Langhammer Christoph³^ORCID,Kadkhodazadeh Shima¹^ORCID

Affiliation:

1. DTU Nanolab, Technical University of Denmark, Fysikvej, 2800 Kgs Lyngby, Denmark

2. Thin Film Physics Division, Department of Physics, Chemistry and Biology (IFM), Linköping University, Linköping SE-58183, Sweden

3. Department of Physics, Chalmers University of Technology, 412 96 Göteborg, Sweden

4. Department of Physics, Informatics and Mathematics, University of Modena and Reggio Emilia, 41121 Modena, Italy

5. Department of Energy Conversion and Storage, Technical University of Denmark, Fysikvej, 2800 Kgs. Lyngby, Denmark

Funder

Vetenskapsrådet

Knut och Alice Wallenbergs Stiftelse

Villum Fonden

Publisher

American Chemical Society (ACS)

Subject

Materials Science (miscellaneous),Chemistry (miscellaneous)

Link

Reference54 articles.

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