Thickness and Interfacial Roughness Changes in Polymer Thin Films during X-Irradiation-Reference-Cited by-同舟云学术

Thickness and Interfacial Roughness Changes in Polymer Thin Films during X-Irradiation

Published:2006-01-27 Issue:4 Volume:39 Page:1545-1553
ISSN:0024-9297
Container-title:Macromolecules
language:en
Short-container-title:Macromolecules

Author:

Richter Andrew G.¹,Guico Rodney¹,Shull Ken¹,Wang Jin¹

Affiliation:

1. Advanced Photon Source, Argonne National Laboratory, Argonne, Illinois 60439, and Department of Materials Science, Northwestern University, Evanston, Illinois 60208

Publisher

American Chemical Society (ACS)

Subject

Materials Chemistry,Inorganic Chemistry,Polymers and Plastics,Organic Chemistry

Link

https://pubs.acs.org/doi/pdf/10.1021/ma050060v

Reference51 articles.

1. Monolayer Damage in XPS Measurements As Evaluated by Independent Methods

2. Beam damage of self‐assembled monolayers

3. X-ray Induced Damage of Self-Assembled Alkanethiols on Gold and Indium Phosphide

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