X-ray radiation damage of organic semiconductor thin films during grazing incidence diffraction experiments
Author:
Publisher
Elsevier BV
Subject
Instrumentation,Nuclear and High Energy Physics
Reference44 articles.
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2. In situ X-ray synchrotron study of organic semiconductor ultra-thin films growth
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4. Crystal Grain Orientation in Organic Homo- and Heteroepitaxy of Pentacene and Perfluoropentacene Studied with X-ray Spectromicroscopy
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