In situ X-ray synchrotron study of organic semiconductor ultra-thin films growth-Reference-Cited by-同舟云学术

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In situ X-ray synchrotron study of organic semiconductor ultra-thin films growth

Published:2006-05 Issue:1 Volume:246 Page:122-126
ISSN:0168-583X
Container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Author:

Moulin J.-F.,Dinelli F.,Massi M.,Albonetti C.,Kshirsagar R.,Biscarini F.

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference6 articles.

1. http://www.esrf.fr/UsersAndScience/Experiments/SurfaceScience/ID03/.

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