Gate Control of the Current–Flux Relation of a Josephson Quantum Interferometer Based on Proximitized Metallic Nanojuntions-Reference-Cited by-同舟云学术

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Gate Control of the Current–Flux Relation of a Josephson Quantum Interferometer Based on Proximitized Metallic Nanojuntions

Published:2021-09-08 Issue:9 Volume:3 Page:3927-3935
ISSN:2637-6113
Container-title:ACS Applied Electronic Materials
language:en
Short-container-title:ACS Appl. Electron. Mater.

Author:

De Simoni Giorgio¹^ORCID,Battisti Sebastiano¹²,Ligato Nadia¹,Mercaldo Maria Teresa³,Cuoco Mario⁴,Giazotto Francesco¹

Affiliation:

1. NEST, Istituto Nanoscienze-CNR and Scuola Normale Superiore, I-56127 Pisa, Italy

2. Department of Physics “E. Fermi”, Universitá di Pisa, Largo Pontecorvo 3, I-56127 Pisa, Italy

3. Dipartimento di Fisica “E. R. Caianiello”, Universitá di Salerno, Fisciano, Salerno IT-84084, Italy

4. SPIN-CNR, Fisciano, Salerno IT-84084, Italy

Funder

Horizon 2020 Framework Programme

H2020 European Research Council

Publisher

American Chemical Society (ACS)

Subject

Materials Chemistry,Electrochemistry,Electronic, Optical and Magnetic Materials

Link

https://pubs.acs.org/doi/pdf/10.1021/acsaelm.1c00508

Reference45 articles.

1. Metallic supercurrent field-effect transistor

2. Ultra-Efficient Superconducting Dayem Bridge Field-Effect Transistor

3. Field-effect control of metallic superconducting systems

4. Magnetotransport Experiments on Fully Metallic Superconducting Dayem-Bridge Field-Effect Transistors

5. Niobium Dayem nano-bridge Josephson gate-controlled transistors

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1. Supercurrent rectification with time-reversal symmetry broken multiband superconductors;Physical Review B;2024-08-02

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3. Colloquium : Spin-orbit effects in superconducting hybrid structures;Reviews of Modern Physics;2024-05-28

4. Gate-controlled supercurrent effect in dry-etched Dayem bridges of non-centrosymmetric niobium rhenium;Nano Research;2024-04-22

5. Impact of on-chip gate voltage on the electric properties of NbTiN superconducting nanowire transistor;Applied Physics Letters;2024-03-25

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