Charge Carrier Trapping Processes in RE2O2S (RE = La, Gd, Y, and Lu)
Author:
Affiliation:
1. Delft University of Technology, Faculty of Applied Sciences, Department of Radiation Science and Technology (FAME-RST), Mekelweg 15, 2629JB Delft, The Netherlands
Funder
Ministerie van Economische Zaken
Stichting voor de Technische Wetenschappen
Publisher
American Chemical Society (ACS)
Subject
Surfaces, Coatings and Films,Physical and Theoretical Chemistry,General Energy,Electronic, Optical and Magnetic Materials
Link
http://pubs.acs.org/doi/pdf/10.1021/acs.jpcc.7b01577
Reference45 articles.
1. Long persistent phosphors—from fundamentals to applications
2. Persistent Luminescence in Eu2+-Doped Compounds: A Review
3. Persistent Luminescence in Non-Eu2+-Doped Compounds: A Review
4. Storage Phosphors for Medical Imaging
5. Survey of the Spectra of the Divalent Rare‐Earth Ions in Cubic Crystals
Cited by 43 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Thermoluminescence (TL) properties of Eu3+ incorporated with CaB4O7 phosphors prepared by solution-combustion process;Applied Radiation and Isotopes;2024-09
2. Persistent Luminescent Nanoparticle-Loaded Filaments for Identification of Fabrics in the Visible and Infrared;Nanomaterials;2024-08-29
3. Charge carrier trapping management in Bi3+ and lanthanides doped Li(Sc,Lu)GeO4 for x-ray imaging, anti-counterfeiting, and force recording;Applied Physics Reviews;2024-02-21
4. A brief review of characteristic luminescence properties of Eu3+ in mixed-anion compounds;Dalton Transactions;2024
5. Near-infrared afterglow enhancement of ZnGa2O4:Cr3+via regulating trap distribution guided by the VRBE diagram;Dalton Transactions;2024
1.学者识别学者识别
2.学术分析学术分析
3.人才评估人才评估
"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370
www.globalauthorid.com
TOP
Copyright © 2019-2024 北京同舟云网络信息技术有限公司 京公网安备11010802033243号 京ICP备18003416号-3