In-Depth Inhomogeneities in CIGS Solar Cells: Identifying Regions for Performance Limitations by PIXE and EBS-Reference-Cited by-同舟云学术

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In-Depth Inhomogeneities in CIGS Solar Cells: Identifying Regions for Performance Limitations by PIXE and EBS

Published:2021-07-16 Issue:29 Volume:125 Page:16155-16165
ISSN:1932-7447
Container-title:The Journal of Physical Chemistry C
language:en
Short-container-title:J. Phys. Chem. C

Author:

Corregidor Victoria¹²^ORCID,Barreiros M. Alexandra³,Salomé Pedro M. P.⁴⁵,Alves Luís C.¹

Affiliation:

1. C2TN, Campus Tecnológico e Nuclear, Instituto Superior Técnico, Universidade de Lisboa, E.N. 10, Sacavém 2686-953, Portugal

2. IPFN, Instituto Superior Técnico, Universidade de Lisboa, Lisboa 1049-001, Portugal

3. Laboratório Nacional de Energia e Geologia, UME, Estrada do Paço do Lumiar, 22, Lisboa 1649-038, Portugal

4. International Iberian Nanotechnology Laboratory, Braga 4715-330, Portugal

5. Departamento de Física, Universidade de Aveiro, Aveiro 3810-193, Portugal

Funder

European Regional Development Fund

Funda????o para a Ci??ncia e a Tecnologia

Publisher

American Chemical Society (ACS)

Subject

Surfaces, Coatings and Films,Physical and Theoretical Chemistry,General Energy,Electronic, Optical and Magnetic Materials

Link

https://pubs.acs.org/doi/pdf/10.1021/acs.jpcc.1c02731

Reference40 articles.

1. Thin film depth profiling by ion beam analysis

2. High-Throughput PIXE as an Essential Quantitative Assay for Accurate Metalloprotein Structural Analysis: Development and Application

3. Editorial Board

4. On the accuracy of Total-IBA

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