On the accuracy of Total-IBA
Author:
Publisher
Elsevier BV
Subject
Instrumentation,Nuclear and High Energy Physics
Reference99 articles.
1. Tutorial review: thin film depth profiling by Ion beam analysis;Jeynes;Analyst,2016
2. Accurate determination of quantity of material in thin films by Rutherford backscattering spectrometry;Jeynes;Anal. Chem.,2012
3. as a new primary direct reference method for measuring quantity of material;Jeynes;Nucl. Instrum. Methods Phys. Res. Sect. B,2017
4. Accurate experimental determination of gallium K- and L3-shell XRF fundamental parameters;Unterumsberger;J. Anal. At. Spectrom.,2018
5. “Total IBA” – Where are we?;Jeynes;Nucl. Instrum. Methods Phys. Res. Sect. B,2012
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