Enhancing Short-Wave Infrared Photosensitivity of SiGe Nanocrystals-Based Films through Embedding Matrix-Induced Passivation, Stress, and Nanocrystallization
Author:
Affiliation:
1. National Institute of Materials Physics, 405A Atomistilor Street, 077125 Magurele, Romania
2. Academy of Romanian Scientists, 54 Splaiul Independentei, 050094 Bucharest, Romania
Funder
CNCS ? UEFISCDI
Romanian Ministry of Research, Innovation and Digitalization
Publisher
American Chemical Society (ACS)
Link
https://pubs.acs.org/doi/pdf/10.1021/acs.jpcc.3c06996
Reference95 articles.
1. A SiGe/Si Nanostructure with Graphene Absorbent for Long Wavelength Infrared Detection
2. Self-Organized Germanium Quantum Dots/Si3N4 Enabling Monolithic Integration of Top Si3N4-Waveguided Microdisk Light Emitters and p-i-n Photodetectors for On-Chip Sensing
3. Thermoelectric Efficiency of Epitaxial GeSn Alloys for Integrated Si-Based Applications: Assessing the Lattice Thermal Conductivity by Raman Thermometry
4. Direct-bandgap emission from hexagonal Ge and SiGe alloys
5. Quantum dot arrays in silicon and germanium
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