Composition and Strain Imaging of Epitaxial In-Plane SiGe Alloy Nanowires by Micro-Raman Spectroscopy-Reference-Cited by-同舟云学术

Composition and Strain Imaging of Epitaxial In-Plane SiGe Alloy Nanowires by Micro-Raman Spectroscopy

Author:

Alonso M. I.¹,Bailo E.²,Garriga M.¹,Molero A.¹,Vaccaro P. O.¹³,Goñi A. R.¹³,Ruiz A.⁴,Alonso M.⁴

Affiliation:

1. Institut de Ciència de Materials de Barcelona (ICMAB-CSIC), Campus de la UAB, 08193 Bellaterra, Spain

2. WITec GmbH, Lise-Meitner-Strasse 6, 89081 Ulm, Germany

3. Institució Catalana de Recerca i Estudis Avançats (ICREA), Passeig Lluís Companys 23, 08010 Barcelona, Spain

4. Instituto de Ciencia de Materiales de Madrid (ICMM-CSIC), Sor Juana Inés de la Cruz 3, Cantoblanco, 28049 Madrid, Spain

Funder

Ministerio de Econom?a y Competitividad

Publisher

American Chemical Society (ACS)

Subject

Surfaces, Coatings and Films,Physical and Theoretical Chemistry,General Energy,Electronic, Optical and Magnetic Materials

Link

Reference36 articles.

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