Thickness-Dependent Raman Scattering from Thin-Film Systems-Reference-Cited by-同舟云学术

Thickness-Dependent Raman Scattering from Thin-Film Systems

Published:2023-02-03 Issue:6 Volume:127 Page:2995-3004
ISSN:1932-7447
Container-title:The Journal of Physical Chemistry C
language:en
Short-container-title:J. Phys. Chem. C

Author:

Van Velson Nathan¹^ORCID,Zobeiri Hamidreza²,Wang Xinwei²^ORCID

Affiliation:

1. Research and Development Department, Advanced Cooling Technologies, Inc., 1046 New Holland Avenue, Lancaster, Pennsylvania17601-5688, United States

2. Department of Mechanical Engineering, Iowa State University, 271 ASC II, 1915 Scholl Road, Ames, Iowa50011, United States

Funder

U.S. Department of Defense

Division of Chemical, Bioengineering, Environmental, and Transport Systems

Publisher

American Chemical Society (ACS)

Subject

Surfaces, Coatings and Films,Physical and Theoretical Chemistry,General Energy,Electronic, Optical and Magnetic Materials

Link

https://pubs.acs.org/doi/pdf/10.1021/acs.jpcc.2c06353

Reference38 articles.

1. Optical characterization of layers for silicon microelectronics

2. Making graphene visible

3. Graphene Thickness Determination Using Reflection and Contrast Spectroscopy

4. Rapid and Reliable Thickness Identification of Two-Dimensional Nanosheets Using Optical Microscopy

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