Graphene Thickness Determination Using Reflection and Contrast Spectroscopy-Reference-Cited by-同舟云学术

Graphene Thickness Determination Using Reflection and Contrast Spectroscopy

Published:2007-07-26 Issue:9 Volume:7 Page:2758-2763
ISSN:1530-6984
Container-title:Nano Letters
language:en
Short-container-title:Nano Lett.

Author:

Ni Z. H.¹,Wang H. M.¹,Kasim J.¹,Fan H. M.¹,Yu T.¹,Wu Y. H.¹,Feng Y. P.¹,Shen Z. X.¹

Affiliation:

1. Department of Physics, National University of Singapore, 2 Science Drive 3, Singapore 117542, Division of Physics and Applied Physics, School of Physical and Mathematical Sciences, Nanyang Technological University, 1 Nanyang Walk, Block 5, Level 3, Singapore 637616, and Department of Electrical and Computer Engineering, National University of Singapore, 4 Engineering Drive 3, Singapore 117576

Publisher

American Chemical Society (ACS)

Subject

Mechanical Engineering,Condensed Matter Physics,General Materials Science,General Chemistry,Bioengineering

Link

https://pubs.acs.org/doi/pdf/10.1021/nl071254m

Reference39 articles.

1. Electric Field Effect in Atomically Thin Carbon Films

2. Two-dimensional atomic crystals

3. The rise of graphene

4. The Band Theory of Graphite

5. Band Structure of Graphite

Cited by 1054 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Anomalous mass transfer behavior of organic molecules in crosslinked graphene oxide membranes induced by intermolecular forces;Journal of Membrane Science;2024-12

2. Experimental and theoretical investigation of nanodiamond insertion on the interlayer interaction in multilayer stacking graphene;Carbon;2024-10

3. Analytical and experimental study on bilayer membrane-type Capacitive Micromechanical Ultrasonic Transducer;Sensors and Actuators A: Physical;2024-10

4. Comprehensive study of optical contrast, reflectance, and Raman spectroscopy of multilayer graphene;Carbon Trends;2024-09

5. A back-to-back diode model applied to van der Waals Schottky diodes;Journal of Physics: Condensed Matter;2024-08-09