Modifying the Electron-Trapping Process at the BiVO4 Surface States via the TiO2 Overlayer for Enhanced Water Oxidation
Author:
Affiliation:
1. Materials Science and Engineering, Koç University, 34450 Istanbul, Turkey
2. Koç University Tüpraş Energy Center (KUTEM), 34450 Istanbul, Turkey
3. Department of Chemistry, Koç University, 34450 Istanbul, Turkey
Funder
T??rkiye Bilimsel ve Teknolojik Ara??tirma Kurumu
Publisher
American Chemical Society (ACS)
Subject
General Materials Science
Link
https://pubs.acs.org/doi/pdf/10.1021/acsami.1c16847
Reference49 articles.
1. The Origin of Slow Carrier Transport in BiVO4 Thin Film Photoanodes: A Time-Resolved Microwave Conductivity Study
2. WO3/BiVO4: impact of charge separation at the timescale of water oxidation
3. Role of Tungsten Doping on the Surface States in BiVO4 Photoanodes for Water Oxidation: Tuning the Electron Trapping Process
4. Photocatalytic Water Oxidation on BiVO4 with the Electrocatalyst as an Oxidation Cocatalyst: Essential Relations between Electrocatalyst and Photocatalyst
5. The significance of the local structure of cobalt-based catalysts on the photoelectrochemical water oxidation activity of BiVO4
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