Probing Surface Microthermal Properties by Scanning Thermal Microscopy-Reference-Cited by-同舟云学术

Probing Surface Microthermal Properties by Scanning Thermal Microscopy

Published:1999-09-11 Issue:24 Volume:15 Page:8340-8343
ISSN:0743-7463
Container-title:Langmuir
language:en
Short-container-title:Langmuir

Author:

Gorbunov V. V.¹,Fuchigami N.¹,Hazel J. L.¹,Tsukruk V. V.¹

Affiliation:

1. Metal-Polymer Institute, National Academy of Science, Gomel, 246550, Belarus, Department of Materials Science & Engineering, Iowa State University, Ames, Iowa 50011, and Air Force Research Laboratory/MLBP, Wright-Patterson Air Force Base, Ohio 45433

Publisher

American Chemical Society (ACS)

Subject

Electrochemistry,Spectroscopy,Surfaces and Interfaces,Condensed Matter Physics,General Materials Science

Link

https://pubs.acs.org/doi/pdf/10.1021/la990913a

Reference17 articles.

1. Williams, C. C.; Wickramasinghe, H. K. InPhotoacoustic andPhotothermal Phenomena; Springer-Verlag: Berlin, 1988; p 364.

2. Thermal imaging using the atomic force microscope

3. Photo-thermal characterization of solids and thin films by optical and scanning probe techniques

4. Localized thermal analysis using a miniaturized resistive probe

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