A robust high sensitivity scanning thermal probe for simultaneous microscale thermal and thermoelectric property mapping
Author:
Affiliation:
1. Department of Aerospace and Mechanical Engineering, University of Notre Dame, 374 Fitzpatrick Hall, Notre Dame, Indiana 46556, USA
Funder
U.S. Department of Energy
National Science Foundation
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
https://aip.scitation.org/doi/pdf/10.1063/5.0058661
Reference29 articles.
1. A microprobe technique for simultaneously measuring thermal conductivity and Seebeck coefficient of thin films
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4. Thermal conductivity profile determination in proton-irradiated ZrC by spatial and frequency scanning thermal wave methods
5. Unraveling Self-Doping Effects in Thermoelectric TiNiSn Half-Heusler Compounds by Combined Theory and High-Throughput Experiments
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