Binary Pt–Si Nanostructures Prepared by Focused Electron-Beam-Induced Deposition-Reference-Cited by-同舟云学术

Binary Pt–Si Nanostructures Prepared by Focused Electron-Beam-Induced Deposition

Published:2011-11-29 Issue:12 Volume:5 Page:9675-9681
ISSN:1936-0851
Container-title:ACS Nano
language:en
Short-container-title:ACS Nano

Author:

Winhold Marcel¹,Schwalb Christian H.¹,Porrati Fabrizio¹,Sachser Roland¹,Frangakis Achilleas S.¹,Kämpken Britta¹,Terfort Andreas¹,Auner Norbert¹,Huth Michael¹

Affiliation:

1. Physikalisches Institut, ‡Institut für Biophysik, and §Institut für Anorganische und Analytische Chemie, Goethe Universität, 60438 Frankfurt am Main, Germany.

Publisher

American Chemical Society (ACS)

Subject

General Physics and Astronomy,General Engineering,General Materials Science

Link

https://pubs.acs.org/doi/pdf/10.1021/nn203134a

Reference39 articles.

1. Advanced photolithographic mask repair using electron beams

2. Single-crystal nanowires grown via electron-beam-induced deposition

3. Fabrication and Functionalization of Nanochannels by Electron-Beam-Induced Silicon Oxide Deposition

4. Granular Co–C nano-Hall sensors by focused-beam-induced deposition

5. Domain wall conduit behavior in cobalt nanowires grown by focused electron beam induced deposition

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