Preparation of Atomically Smooth Germanium Substrates for Infrared Spectroscopic and Scanning Probe Microscopic Characterization of Organic Monolayers
Author:
Affiliation:
1. Department of Chemistry, University of Georgia, Athens, Georgia 30602-2556, and School of Chemistry & Biochemistry, Georgia Institute of Technology, Atlanta, Georgia 30332-0400
Publisher
American Chemical Society (ACS)
Subject
Electrochemistry,Spectroscopy,Surfaces and Interfaces,Condensed Matter Physics,General Materials Science
Link
https://pubs.acs.org/doi/pdf/10.1021/la970287m
Reference25 articles.
1. Scanning Probe Microscopy and Spectroscopy
2. Dimer–adatom–stacking-fault (DAS) and non-DAS (111) semiconductor surfaces: A comparison of Ge(111)-c(2×8) to Si(111)-(2×2), -(5×5), -(7×7), and -(9×9) with scanning tunneling microscopy
3. Scanning tunneling microscopy and spectroscopy of cleaved and annealed Ge(111) surfaces
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1. Estimation of liquid phase diffusion coefficients of gallium and antimony in germanium from segregation data in crystal growth experiments;Journal of Crystal Growth;2008-07
2. Infrared Spectroscopy of Biophysical Monomolecular Films at Interfaces: Theory and Applications;Applied Spectroscopy Reviews;2000-11-23
3. Attenuated Total Reflection Infrared Studies of Bilayers Self-Assembled onto a Germanium Prism;Langmuir;2000-06-17
4. Reversible Phase Transformation on Ge(111) Surface by Potential;Electrochemical and Solid-State Letters;1999
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