Investigation of aluminum gallium arsenide/gallium arsenide superlattices by atomic force microscopy
Author:
Publisher
American Chemical Society (ACS)
Subject
Analytical Chemistry
Link
https://pubs.acs.org/doi/pdf/10.1021/ac00041a005
Cited by 13 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Determination of multilayer thicknesses of GaAs/AlAs superlattice by grazing incidence X-ray reflectivity;International Journal of Metrology and Quality Engineering;2013
2. Atomic Force Microscopy Studies of SnO 2 Thin Film Microstruc tures Deposited by Atomic Layer Epitaxy;Microchimica Acta;2000-06-19
3. Two-dimensional nanometer-scale calibration based on one-dimensional gratings;Applied Physics A: Materials Science & Processing;1998-03-01
4. Fracture properties of GaAs–AlAs superlattices studied by atomic force microscopy and scanning electron microscopy;Acta Materialia;1998-01
5. Progress in the layer thickness determination of AlGaAs/GaAs heterostructures using selective etching and AFM imaging of the (110) cleavage planes;Materials Science and Engineering: B;1997-02
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