Atomic Force Microscopy Studies of SnO 2 Thin Film Microstruc tures Deposited by Atomic Layer Epitaxy
Author:
Publisher
Springer Science and Business Media LLC
Subject
Analytical Chemistry
Link
http://link.springer.com/content/pdf/10.1007/s006040070080.pdf
Cited by 27 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Crystal Structure, Lattice Strain, Morphology, and Electrical Properties of SnO2 Nanoparticles Induced by Low Calcination Temperature;Advances in Materials Science and Engineering;2020-07-22
2. Electrical characteristics and carrier injection mechanisms of atomic layer deposition synthesized n-SnO2/p-Si heterojunction;Materials Research Express;2018-12-19
3. Towards monomaterial p-n junctions: Single-step fabrication of tin oxide films and their non-destructive characterisation by angle-dependent X-ray photoelectron spectroscopy;Applied Physics Letters;2015-12-07
4. Polycrystalline SnO2 films grown by chemical vapor deposition on quartz glass;Vacuum;2015-12
5. Retracted Article: Insights from investigations of tin dioxide and its composites: electron-beam irradiation, fractal assessment, and mechanism;Nanoscale;2015
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