Wavelength-Dispersive Total-Reflection X-ray Fluorescence with an Efficient Johansson Spectrometer and an Undulator X-ray Source: Detection of 10-16 g-Level Trace Metals-Reference-Cited by-同舟云学术

Wavelength-Dispersive Total-Reflection X-ray Fluorescence with an Efficient Johansson Spectrometer and an Undulator X-ray Source: Detection of 10-16 g-Level Trace Metals

Published:2002-07-19 Issue:17 Volume:74 Page:4532-4535
ISSN:0003-2700
Container-title:Analytical Chemistry
language:en
Short-container-title:Anal. Chem.

Author:

Sakurai Kenji¹,Eba Hiromi¹,Inoue Katsuaki¹,Yagi Naoto¹

Affiliation:

1. National Institute for Materials Science, 1-2-1, Sengen, Tsukuba, Ibaraki 305-0047, Japan, and JASRI, SPring-8, 1-1-1, Kouto, Mikazuki, Sayo-gun, Hyogo 679-5198, Japan

Publisher

American Chemical Society (ACS)

Subject

Analytical Chemistry

Link

https://pubs.acs.org/doi/pdf/10.1021/ac025720y

Reference23 articles.

1. Optical Flats for Use in X‐Ray Spectrochemical Microanalysis

2. Review on grazing incidence X-ray spectrometry and reflectometry

3. Synchrotron radiation excited x-ray fluorescence analysis using total reflection of x-rays

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