Analyzing the Nanogranularity of Focused-Electron-Beam-Induced-Deposited Materials by Electron Tomography-Reference-Cited by-同舟云学术

Analyzing the Nanogranularity of Focused-Electron-Beam-Induced-Deposited Materials by Electron Tomography

Author:

Trummer Cornelia¹,Winkler Robert²^ORCID,Plank Harald¹²³^ORCID,Kothleitner Gerald¹³,Haberfehlner Georg³^ORCID

Affiliation:

1. Graz Centre for Electron Microscopy, 8010 Graz, Austria

2. Christian Doppler Laboratory, DEFINE—Institute of Electron Microscopy and Nanoanalysis, Graz University of Technology, 8010 Graz, Austria

3. Institute of Electron Microscopy and Nanoanalysis, Graz University of Technology, 8010 Graz, Austria

Funder

Österreichische Forschungsförderungsgesellschaft

Christian Doppler Forschungsgesellschaft

Bundesministerium für Digitalisierung und Wirtschaftsstandort

Horizon 2020 Framework Programme

Österreichische Nationalstiftung für Forschung, Technologie und Entwicklung

Publisher

American Chemical Society (ACS)

Subject

General Materials Science

Link

Reference26 articles.

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