10.1023/A:1008331029249-Reference-Cited by-同舟云学术

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10.1023/A:1008331029249

Published:2000 Issue:3 Volume:16 Page:193-202
ISSN:0923-8174
Container-title:Journal of Electronic Testing
language:
Short-container-title:

Author:

Manich S.,Gabarró A.,Lopez M.,Figueras J.,Girard P.,Guiller L.,Landrault C.,Pravossoudovitch S.,Teixeira P.,Santos M.

Publisher

Springer Science and Business Media LLC

Subject

Electrical and Electronic Engineering

Cited by 18 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Test pattern generation using thermometer code counter in TPC technique for BIST implementation;Microprocessors and Microsystems;2019-11

2. A P-N Sequence Generator Using LFSR with Dual Edge Trigger Technique;MATEC Web of Conferences;2016

3. VLSI Implementation of Low Power Multiple Single Input Change (MSIC) Test Pattern Generation for BIST Scheme;2014 Fifth International Symposium on Electronic System Design;2014-12

4. Test Patterns of Multiple SIC Vectors: Theory and Application in BIST Schemes;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2013-04

5. A unified solution to reduce test power and test volume for Test-per-scan schemes;IEICE Electronics Express;2010

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