Influence of Si on the Structural, Electrical, and Optical Properties of (Al, Ti, Si)N Films Deposited Via Reactive DC Sputtering

Author:

Palacios A.M. Guzman1,Olaya J.J.1ORCID,Alfonso J.E.1ORCID

Affiliation:

1. Universidad Nacional de Colombia, Colombia

Publisher

FapUNIFESP (SciELO)

Subject

Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science

Reference37 articles.

1. Microstructural modification of (Ti 1-x Al x Si y) N thin film coatings as a function of nitrogen concentration;Biró D;Acta Universitatis Sapientiae Electrical and Mechanical Engineering.,2010

2. The influence of growth defects in sputter-deposited TiAlN hard coatings on their tribological behavior;Panjan P;Surf Coat Tech,2016

3. Influence of deposition angle on the structural, morphological and optical properties of sputtered AlN thin films;Ravankhah M;Optik (Stuttg)

4. TiAlN and TiAlCN deposition in an industrial PaCVD-plant;Heim D;Surf Coat Tech,1998

5. Influence of the abrasive particles size in the micro-abrasion wear tests of TiAlSiN thin coatings;Andrade MFC;Wear,2009

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