Critical Review of 1-Particle Models in Electromigration Resistance Change Modeling

Abstract

ABSTRACTAn investigation is made into the capability of one-particle models in modeling electromigration-induced resistance changes. Analytically obtained solutions to the model equations are used to gain more insight into the vacancy distribution as a result of the applied boundary conditions. These solutions are then used to determine the resistance change modeling capabilities of three types of one-particle models.