Quantitative microstructural imaging by scanning Laue x-ray micro- and nanodiffraction-Reference-Cited by-同舟云学术

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Quantitative microstructural imaging by scanning Laue x-ray micro- and nanodiffraction

Published:2016-06 Issue:6 Volume:41 Page:445-453
ISSN:0883-7694
Container-title:MRS Bulletin
language:en
Short-container-title:MRS Bull.

Author:

Chen Xian,Dejoie Catherine,Jiang Tengfei,Ku Ching-Shun,Tamura Nobumichi

Abstract

Abstract

Publisher

Springer Science and Business Media LLC

Subject

Physical and Theoretical Chemistry,Condensed Matter Physics,General Materials Science

Reference89 articles.

1. Complementary use of monochromatic and white-beam X-ray micro-diffraction for the investigation of ancient materials

2. A new white beam x-ray microdiffraction setup on the BM32 beamline at the European Synchrotron Radiation Facility

3. A synchrotron study of defect and strain inhomogeneity in laser-assisted three-dimensionally-printed Ni-based superalloy

4. Crystal lattice tilting in prismatic calcite

5. The Direct Conversion of Heat to Electricity Using Multiferroic Alloys

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