Characterization of Platinum films Deposited by a Two-Step Magnetron Sputtering on SiO2/Si Substrates

Abstract

AbstractIn this study, defect-free Pt films with good adhesion were deposited on SiO2/Si substrates by a two-step magnetron sputtering. This method consists of the first sputtering step using Ar/O2 gas mixture and the second step using Ar. After two-step deposition, an annealing process was followed at 600-1,000 °C in ambient atmosphere. In the first step, oxygen containing Pt films were deposited. Oxygen incorporated in the Pt films completely diffused out during the high temperature annealing. After the annealing process, the film became dense without catastrophic failures such as hillock, pinhole or buckling. Adhesion strength of films produced by this process was good enough to pass a tape test. It is believed that the good adhesion and the observed microstructural evolution are related to the oxygen in Pt films introduced during the first sputtering step. Adhesion, microstructural evolution and the role of oxygen in Pt films are briefly discussed.