Author:
Nitta S.,Kashima T.,Kariya M.,Yukawa Y.,Yamaguchi S.,Amano H.,Akasaki I.
Abstract
The behavior of threading dislocations during mass transport of GaN was investigated in detail by transmission electron microscopy. Mass transport occurred at the surface. Therefore, growing species are supplied from the in-plane direction. The behavior of threading dislocations was found to be strongly affected by the mass transport process as well as the high crystallographic anisotropy of the surface energy of the facets particular to GaN.
Publisher
Springer Science and Business Media LLC
Subject
General Materials Science
Cited by
4 articles.
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