Author:
Cheng T. S.,Foxon C. T.,Jeffs N. J.,Dewsnip D. J.,Flannery L.,Orton J. W.,Novikov S. V.,Ber B. Ya,Kudriavtsev Yu A.
Abstract
This paper discusses the growth of Mg-doped GaN samples using a modified Molecular Beam Epitaxy (MBE) method. Our results suggest that the dopant is incorporated from a surface population maintained by the incident Mg flux by a rapid diffusion mechanism. It follows that the chemical concentration will increase with time of growth and that the p-doping level will also increase progressively with film thickness for a given Mg flux. Increasing the Mg flux to the surface results at first in a higher doping density, but this saturates when the Mg surface concentration reaches a finite value.
Publisher
Springer Science and Business Media LLC
Subject
General Materials Science
Cited by
11 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献