Piezoresistance in silicon and its nanostructures
Author:
Abstract
Publisher
Springer Science and Business Media LLC
Subject
Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science
Reference84 articles.
1. Evaluation of piezoresistive coefficient variation in silicon stress sensors using a four-point bending test fixture
2. Hot-electron trapping activation energy in PMOSFET's under mechanical stress
3. Fermi-Level-Pinning Defects in Highlyn-Doped Silicon
4. Piezoresistance and Piezo-Hall-Effect inn-Type Silicon
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