Improved Algorithm to Extract Force-distance Curves from Scanning Force Microscope Data

Abstract

AbstractPhysically meaningful near-surface force fields are used to calculate simulated scanning force microscope cantilever deflection data. The simulated data is used to evaluate the ability of a few models to calculate forces from cantilever deflections. The conventional simple harmonic oscillator model is shown to be significantly inaccurate in converting deflections to forces. A bending beam model is developed which accurately converts deflections to forces. This model is shown to be necessary for accurate assignment of physical meaning to the calculated forces under high force gradient conditions.