Obtaining Charge Distributions on Geometrically Generic Nanostructures Using Scanning Force Microscopy-Reference-Cited by-同舟云学术

Obtaining Charge Distributions on Geometrically Generic Nanostructures Using Scanning Force Microscopy

Published:2011-01-20 Issue:5 Volume:27 Page:1803-1810
ISSN:0743-7463
Container-title:Langmuir
language:en
Short-container-title:Langmuir

Author:

Jarmusik Keith E.¹,Eppell Steven J.¹,Lacks Daniel J.²,Zypman Fredy R.³

Affiliation:

1. Department of Biomedical Engineering

2. Department of Chemical Engineering

3. Yeshiva University, Departments of Physics, New York, New York 10033, United States

Publisher

American Chemical Society (ACS)

Subject

Electrochemistry,Spectroscopy,Surfaces and Interfaces,Condensed Matter Physics,General Materials Science

Link

https://pubs.acs.org/doi/pdf/10.1021/la104153p

Reference36 articles.

1. Nanoscale Forces and Their Uses in Self-Assembly

2. Eppell, S. J.; Todd, B. A.; Zypman, F. R.Improved algorithm to extract force-distance curves from scanning force microscope data.Materials Issues and Modeling for Device Nanofabrication, 2000, 584, 189−194.

3. Probing the resolution limits and tip interactions of atomic force microscopy in the study of globular proteins

4. Zypman, F. R.; Eppell, S. J.Scanning force microscope to determine interaction forces with high-frequency cantilever. U.S. Patent 6,452,170, September 17, 2002.

5. Electrostatic tip-surface interaction in scanning force microscopy: A convenient expression useful for arbitrary tip and sample geometries

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