Improved analysis of the time domain response of scanning force microscope cantilevers
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1322069
Reference25 articles.
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2. Accuracy of AFM force distance curves via direct solution of the Euler-Bernoulli equation;AIP Advances;2016-03
3. Obtaining Charge Distributions on Geometrically Generic Nanostructures Using Scanning Force Microscopy;Langmuir;2011-01-20
4. Atomic Force Microscopy Sensing Using Multiple Modes;2006 IEEE/RSJ International Conference on Intelligent Robots and Systems;2006-10
5. SENSING IN THE NANO-ENVIRONMENT BASED ON HIGH ORDER HARMONIC MODES OF FLEXIBLE ARM;IFAC Proceedings Volumes;2006
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