Author:
Leamy H. J.,Brown W. L.,Celler G. K.,Foti G.,Gilmer G. H.,Fan J. C. C.
Abstract
ABSTRACTLaser processing of amorphous thin films of amorphous Ge often results in an explosive or self-sustaining crystallization reaction. The reaction is sustained by the heat liberated during crystallization. In a theoretical analysis of the process that was presented at this symposium last year, Gilmer and Leamy postulated the existence of a thin layer of liquid at the propagating interface. The liquid layer forms at temperatures above Ta, the melting point of amorphous Ge, and is predicted to be ~ 0.02 – 0.1 of the film thickness in width. We have obtained experimental confirmation of the presence of this liquid layer.
Publisher
Springer Science and Business Media LLC
Cited by
2 articles.
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