Nanocrystallization of amorphous germanium films observed with nanosecond temporal resolution
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.3518069
Reference12 articles.
1. In situ laser crystallization of amorphous silicon: Controlled nanosecond studies in the dynamic transmission electron microscope
2. Luminescent nanostructures based on Ge nanoparticles embedded in an oxide matrix
3. In situ visualization of interface dynamics during the double laser recrystallization of amorphous silicon thin films
4. Monitoring explosive crystallization phenomenon of amorphous silicon thin films during short pulse duration XeF excimer laser annealing using real-time optical diagnostic measurements
5. In-Situ and Ex-Situ Measurements on Silicon Thin Films Fabricated by Excimer Laser Annealing
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