Advancements in Dimpling Technique for Automatically and Repeatably Thinning TEM Samples to Near Electron Transparency

Author:

Caruino Vincent L.,Hidalgo August J.

Abstract

One of the latest advancements in technique for preparing materials for TEM examination was first made commercially available by VCR Group in 1982. The instrument, known as the DIMPLER®, mechanically thins materials by “dimpling”, a technique which has become widely accepted by material scientists. Since its inception other manufacturers have also produced dimpler-like instruments.

Publisher

Springer Science and Business Media LLC

Subject

General Engineering

Reference4 articles.

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2. 3. Plummer H.K. and Shinozaki S.S. , Mechanical Microthinning: An Alternative to Chemical or Ion Beam Thinning for TEM Specimen Preparation, In: Proceedings of the 42nd Annual Meeting of EMSA, G.W. Bailey, ed. San Francisco

3. The Preparation of Cross-Sectional Specimens for Transmission Electron Microscopy;Bravman;J. Mater. Res.,1984

4. A variation of transmission electron microscope sample preparation for VLSI analysis

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