1. The preparation of cross-section specimens for transmission electron microscopy
2. and (1983) Transmission Electron Microscopy of VLSI Circuits and Structures. John Wiley and Sons, New York.
3. and (1984) Mechanical microthinning: An alternative to chemical or ion beam thinning for TEM specimen preparation. In: Proceedings of the 42nd Annual Meeting of the Electron Microscopy Society of America. G.W. Bailey, ed. San Francisco.