Comparative study of ion milling techniques in cross-sectional transmission electron microscope specimen preparation
Author:
Publisher
Wiley
Subject
Medical Laboratory Technology,Instrumentation,Histology,Anatomy
Reference13 articles.
1. Chemically Assisted Ion Beam Etching (CAIBE)- a New Technique for TEM Specimen Preparation of Materials
2. Experimental Measurement of Transmission Electron Microscope Specimen Temperature during Ion Milling
3. (1987) The possibility of surface polishing by ion beam thinning. Yearbook 1887 of the Research Institute of Technical Physics, Budapest.
4. (1983) Sputtering by Particle Bombardment II. Springer-Verlag, Garching bei München, Federal Republic of Germany.
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3. Preparation of cross-sectional TEM samples for low-angle ion milling;MICROSC RES TECHNIQ;1997
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5. Radiation damage in ion-milled specimens: characteristics, effects and methods of damage limitation;Ultramicroscopy;1993-09
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