Specimen preparation of free-standing, thick-metal, multilayered films in cross section-Reference-Cited by-同舟云学术

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Specimen preparation of free-standing, thick-metal, multilayered films in cross section

Published:1994-02-15 Issue:3 Volume:27 Page:262-267
ISSN:1059-910X
Container-title:Microscopy Research and Technique
language:en
Short-container-title:Microsc. Res. Tech.

Author:

Wall Mark A.

Publisher

Wiley

Subject

Medical Laboratory Technology,Instrumentation,Histology,Anatomy

Reference18 articles.

1. Cross‐sectional specimens for transmission electron microscopy

2. and (1991) TEM specimen preparation of individual SiC/C composite (SCS-6) fibers. In: Proceedings of the 49th EMSA Conference. San Francisco Press, Inc., San Francisco, California, pp. 1104-1105.

3. MRS Symp. Pro;Alani,1992

4. Topographic Kinetics and Practice of Low Angle Ion Beam Thinning

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