Cross‐sectional specimens for transmission electron microscopy
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1663778
Reference3 articles.
1. Dislocation morphology in graded heterojunctions: GaAs1?xPx
2. The Chemical Polishing of Gallium Arsenide in Bromine-Methanol
3. Improvements to the ALBA Machine for Thinning Specimens for Electron Microscopy
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