Author:
Jang Jian Shiu-Ko,Jeng Chih-Cherng,Wang Ting-Chun,Huang Chih-Mu,Wang Ying-Lang,Yoo Woo Sik
Publisher
Springer Science and Business Media LLC
Subject
Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science
Reference29 articles.
1. Per-Pixel Dark Current Spectroscopy Measurement and Analysis in CMOS Image Sensors
2. 25. Webster E.A.G. , Nicol R. , Grant L. , and Renshaw D. : Validated dark current spectroscopy on a per-pixel base in CMOS image sensors. Proceedings of the International Image Sensor Workshop (IISW), Bergen (Norway), 26–28 July, 2009.
3. Dark Current Spectroscopy Of Metals In Silicon
4. CMOS image sensors: State-of-the-art
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