Neutron Scattering Studies of Surfaces and Interfaces

Author:

Majkrzak Charles F.,Felcher Gian P.

Abstract

During the past decade, scientific and technological interest in the properties of surfaces and interfaces has grown at an astounding rate. On first thought, one might not consider a neutron or even an x-ray photon to be a particularly sensitive surface probe given their relatively weak interactions with matter compared to that of a low-energy electron or atom. Indeed, low-energy electron diffraction and atomic beam scattering techniques have contributed significantly to our understanding of surface phenomena. Nonetheless, the very fact that electrons and atoms are so strongly interacting makes quantitative analysis of their scattering data difficult. The interaction of neutrons or x-rays with matter, on the other hand, is weak enough that the potential can be characterized by a relatively simple scattering amplitude. Presently attainable neutron intensities, though not yet comparable to those of x-ray synchrotron sources, are still of sufficient strength to permit a variety of surface or near surface reflectivity and grazing angle diffraction experiments. Because neutrons can distinguish between different isotopes of the same element, most notably hydrogen and deuterium, as well as couple to atomic magnetic moments via a dipolar interaction, they can be indispensable and complementary probes.More conventional neutron diffraction techniques can also be applied to the study of interfacial phenomena and the effects of reduced dimensionality and compositional modulation in super-lattice structures grown by a variety of thin film deposition methods. In this article we will differentiate between reflectivity and diffraction measurements as follows: if the scattering occurs at a wavevector transfer low enough that the scattering medium appears as a continuum, so that amorphous and crystalline states are indistinguishable, then it will be considered to be in the reflectivity regime whereas diffraction will be taken to correspond to higher wavevector transfer where the precise arrangement of atoms is discernible.

Publisher

Springer Science and Business Media LLC

Subject

Physical and Theoretical Chemistry,Condensed Matter Physics,General Materials Science

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370

www.globalauthorid.com

TOP

Copyright © 2019-2024 北京同舟云网络信息技术有限公司
京公网安备11010802033243号  京ICP备18003416号-3