The development of neutron reflectometry as a probe of the nanoscale structure of polymer thin film systems – founded on the pioneering work of Professor Thomas P. Russell-Reference-Cited by-同舟云学术

The development of neutron reflectometry as a probe of the nanoscale structure of polymer thin film systems – founded on the pioneering work of Professor Thomas P. Russell

Published:2023 Issue:10 Volume:15 Page:4725-4737
ISSN:2040-3364
Container-title:Nanoscale
language:en
Short-container-title:Nanoscale

Author:

Majkrzak C. F.¹^ORCID

Affiliation:

1. Center for Neutron Research, National Institute of Standards and Technology, Gaithersburg, MD, USA

Abstract

The pioneering work of Thomas Russell and colleagues helped establish neutron reflectometry as a valuable and often indispensable probe of the nanoscale structure of polymer thin film systems.

Publisher

Royal Society of Chemistry (RSC)

Subject

General Materials Science

Link

http://pubs.rsc.org/en/content/articlepdf/2023/NR/D2NR06756K

Reference31 articles.

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2. Neutron Scattering Studies of Surfaces and Interfaces

3. Recent advances in the study of chemical surfaces and interfaces by specular neutron reflection

4. Neutron reflection from interfaces with biological and biomimetic materials

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