Reflectometry with Polarized Neutrons on In Situ Grown Thin Films-Reference-Cited by-同舟云学术

Reflectometry with Polarized Neutrons on In Situ Grown Thin Films

Published:2021-09-17 Issue: Volume: Page:2100153
ISSN:0370-1972
Container-title:physica status solidi (b)
language:en
Short-container-title:Physica Status Solidi (b)

Author:

Kreuzpaintner Wolfgang¹²³,Schmehl Andreas⁴,Book Alexander³,Mairoser Thomas⁴,Ye Jingfan³,Wiedemann Birgit³,Mayr Sina³,Moulin Jean-François⁵,Stahn Jochen⁶,Gilbert Dustin A.⁷,Gabold Henrik³,Inanloo-Maranloo Zahra³,Heigl Michael⁴,Masalovich Sergey⁸,Georgii Robert⁸,Albrecht Manfred⁴,Mannhart Jochen⁹,Böni Peter³^ORCID

Affiliation:

1. Institute of High Energy Physics Chinese Academy of Sciences (CAS) Beijing 100049 China

2. Spallation Neutron Source Science Center (SNSSC) No. 1 Zhongziyuan Road Dalang 523803 China

3. Physik-Department E21 Technische Universität München James-Franck-Str. 1 Garching 85748 Germany

4. Institut für Physik Universität Augsburg Universitätsstraße 1 Augsburg 86159 Germany

5. German Engineering Materials Science Centre (GEMS) Heinz Maier-Leibnitz Zentrum (MLZ) Helmholtz-Zentrum Geesthacht GmbH Lichtenbergstr. 1 Garching bei München 85747 Germany

6. Laboratory for Neutron Scattering and Imaging Paul Scherrer Institut (PSI) Villigen CH-5232 Switzerland

7. Department of Materials Science and Engineering University of Tennessee Knoxville TN 37996 USA

8. Heinz Maier-Leibnitz Zentrum (MLZ, FRM II) Technische Universität München Lichtenbergstr. 1 Garching 85748 Germany

9. Solid State Quantum Electronics Max-Planck-Institut für Festkörperforschung Heisenbergstraße 1 70 569 Stuttgart Germany

Funder

Deutsche Forschungsgemeinschaft

Publisher

Wiley

Subject

Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1002/pssb.202100153

Reference82 articles.

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2. Physics of Ultrathin Films and Heterostructures of Rare-Earth Nickelates

3. Interfacial Control of Magnetic Properties at LaMnO3/LaNiO3 Interfaces

4. Quantum-Matter Heterostructures

5. X-ray and neutron reflectivity analysis of thin films and superlattices

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