Electrochemical strain microscopy: Probing ionic and electrochemical phenomena in solids at the nanometer level-Reference-Cited by-同舟云学术

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Electrochemical strain microscopy: Probing ionic and electrochemical phenomena in solids at the nanometer level

Published:2012-07 Issue:7 Volume:37 Page:651-658
ISSN:0883-7694
Container-title:MRS Bulletin
language:en
Short-container-title:MRS Bull.

Author:

Jesse Stephen,Kumar Amit,Arruda Thomas M.,Kim Yunseok,Kalinin Sergei V.,Ciucci Francesco

Abstract

Abstract

Publisher

Springer Science and Business Media LLC

Subject

Physical and Theoretical Chemistry,Condensed Matter Physics,General Materials Science

Reference72 articles.

1. Nanoscale mapping of ion diffusion in a lithium-ion battery cathode

2. Local impedance imaging and spectroscopy of polycrystalline ZnO using contact atomic force microscopy

3. Nano-chemistry and scanning probe nanolithographies

4. Local oxidation of silicon surfaces by dynamic force microscopy: Nanofabrication and water bridge formation

5. Fast Interfacial Ionic Conduction in Nanostructured Glass Ceramics

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