Moment-based Modeling of Extended Defects for Simulation of TED: What Level of Complexity is Necessary?

Author:

Gencer Alp H.,Dunham Scott T.

Abstract

ABSTRACTAccurate modeling of extended defect kinetics is of primary importance for predictive modeling of transient enhanced diffusion (TED). Our previously developed model accurately accounts for extended defects and can be used predictively for TED. Using some experimental knowledge about the distribution of the extended defect population we can simplify our model. We demonstrate that reducing the number of solution variables by one doesn't affect the predictive capabilities of the model for extended defect kinetics and TED. However, some caution has to be used when applying the same principles to modeling of dopant deactivation.

Publisher

Springer Science and Business Media LLC

Subject

General Engineering

Cited by 3 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Transient-diffusion effects;Applied Physics A: Materials Science & Processing;2003-05-01

2. Current status of models for transient phenomena in dopant diffusion and activation;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2002-01

3. A reduced approach for modeling the influence of nanoclusters and {113} defects on transient enhanced diffusion;Applied Physics Letters;2001-10-15

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