Failure Analysis for Gold Wire Bonding of Sensor Packaging Based on Experimental and Numerical Methods

Author:

Sun Yameng1,Ma Kun1ORCID,Song Yifan2,Zi Tongtong3,Liu Xun1,Feng Zheng3,Zhou Yang3,Liu Sheng1234ORCID

Affiliation:

1. Laboratory for Electronic Manufacturing and Packaging Integration, The Institute of Technological Sciences, Wuhan University, Wuhan 430070, China

2. School of Mechanical Science and Engineering, Huazhong University of Science and Technology, Wuhan 430070, China

3. Hefei Archimedes Electronic Technology Co., Ltd., Hefei 230000, China

4. School of Power and Mechanical Engineering, Wuhan University, Wuhan 430070, China

Abstract

There is an increasing demand for the use of automotive sensors where complex working environments may easily lead to failure. Wire pull and shear test models based on finite-element analysis are established to evaluate their reliability by investigating the failure mode and mechanism of gold wire bonding. The effect of shear force position and pull force position on failure is also analyzed. The bonding failure was verified by experiments, which is consistent with the simulation result. The results show that: (1) The three-dimensional quantitative modeling reveals the process of bonding delamination and stress concentration. (2) The bonding–slip method (BSM) is adopted in the gold ball detaching process. The concept of three states, including deformation accumulation, cracking, and disengagement, was put forward to reveal the interface stress evolution trend according to the shear testing results. The results indicate that in the interface, the stress in the deformation accumulation state decreases from the tensile side (or compression side) to the center, and the stress in the cracking and disengagement states reduces gradually from the tensile side to the edge. When the interface is completely separated, the failed shear force concentrates on 42 g. The concept and theory proposed in this work can effectively reveal the failure mechanism of bonding interface and help to establish a new failure criterion.

Funder

the National Key R&D Program of China

Publisher

MDPI AG

Subject

Electrical and Electronic Engineering,Mechanical Engineering,Control and Systems Engineering

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