Refractive Index Variation of Magnetron-Sputtered a-Si1−xGex by “One-Sample Concept” Combinatory-Reference-Cited by-同舟云学术

Refractive Index Variation of Magnetron-Sputtered a-Si1−xGex by “One-Sample Concept” Combinatory

Published:2018-05-21 Issue:5 Volume:8 Page:826
ISSN:2076-3417
Container-title:Applied Sciences
language:en
Short-container-title:Applied Sciences

Author:

Lohner Tivadar,Kalas Benjamin,Petrik Peter,Zolnai Zsolt,Serényi Miklós,Sáfrán György

Funder

Országos Tudományos Kutatási Alapprogramok

Publisher

MDPI AG

Subject

Fluid Flow and Transfer Processes,Computer Science Applications,Process Chemistry and Technology,General Engineering,Instrumentation,General Materials Science

Link

http://www.mdpi.com/2076-3417/8/5/826/pdf

Reference26 articles.

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2. Substitutional carbon inSi1−xGex

3. Electrical characterization of SiGe heterostructure bipolar transistors

4. Schottky Barrier Diode Circuits in Silicon for Future Millimeter-Wave and Terahertz Applications

5. Recent progress in infrared detector technologies

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