Characterization of Gamma-Rays-Induced Spring Wheat Mutants for Morphological and Quality Traits through Multivariate and GT Bi-Plot Analysis

Abstract

Exploiting new genetic resources is an effective way to achieve sustainable wheat production. To this end, we exposed wheat seeds of the “Punjab-11” cultivar to gamma rays. A total of 32 stable mutants (M7) were developed, followed by characterization by conducting multilocation trials over two seasons. Principal component analysis (PCA) showed that the first six components accounted for 90.28% of the total variation among the plant height, tillers per plant, 1000-kernel weight, grain yield, and quality traits. All mutants were grouped into three clusters based on high yield index values. The genotype by trait (GT) bi-plot revealed significant associations between yield and its components among the mutants. Positive correlations were estimated for tillers per plant, plant height, 1000-kernel weight, and grain yield; however, yield components showed negative associations with protein, moisture, and gluten contents. The mutant lines Pb-M-59 waxy, Pb-M-1272 waxy, Pb-M-2260, Pb-M-1027 waxy, Pb-M-1323 waxy, and Pb-M-1854 exhibited maximum grain yield, 1000-grain weight, and tillers per plant values. Likewise, Pb-M-2725, Pb-M-2550, and Pb-M-2728 were found to be the best mutant lines in terms of grain quality; thus, the use of gamma radiation is effective in improving the desirable traits, including yield and grain quality. It is suggested that these traits can be improved beyond the performance of corresponding traits in their parent genotypes. The newly produced mutants can also be used to explore the genetic mechanisms of complex traits in the future.