Influence of Active Afterheater in the Crystal Growth of Gallium Oxide via Edge-Defined Film-Fed Growing Method

Author:

Jeong Woon-Hyeon12ORCID,Choi Su-Min3,Lim Su-Min1,Shin Yun-Ji1,Bae Si-Young1,Kang Jin-Ki4,Lee Won-Jae3ORCID,Kwon Se-Hun2ORCID,Jeong Seong-Min1ORCID

Affiliation:

1. Semiconductor Materials Center, Korea Institute of Ceramic Engineering and Technology, Jinju 52851, Republic of Korea

2. School of Materials Science and Engineering, Pusan National University, Busan 46241, Republic of Korea

3. School of Advanced Materials Engineering, Dong-Eui University, Busan 51140, Republic of Korea

4. AXEL Co., Ltd., Jinju 52818, Republic of Korea

Abstract

In this study, we explored the effect of an active afterheater on the growth of gallium oxide single crystals using the EFG method. We analyzed the temperature distribution of the crystal under the growing process through multiphysics simulations of the models with and without an active afterheater and investigated the morphology of crystals by applying each model to real experimental growths. The afterheater is a component in the growing furnace that activates radiant heat transfer, and its performance depends on its location, size, material, and shape. The simulation results showed that the afterheater applied in this study was found to be effective in obtaining good temperature distribution in the reactor. Through experimental crystal growth corresponding to the simulation approaches, it was confirmed that an appropriate afterheater reduces thermal stress at the growth front and provides a thermal annealing effect on the post-grown crystals during the growing process to improve crystal quality.

Funder

Nano & Material Technology Development Program through the National Research Foundation of Korea (NRF), which is funded by the Ministry of Science and ICT

Publisher

MDPI AG

Subject

Inorganic Chemistry,Condensed Matter Physics,General Materials Science,General Chemical Engineering

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